Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences Veco Square Center Reference 300 mesh Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Nickel
Pitch: 83 µm
Hole: 45 µm
Bar: 38 µm
Electron Microscopy Sciences MAC Custom Block of 10 Microanalysis Standards
Pure metal and compounds standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. The standards are polished to a 0.25 micron diamond finish and carbon coated and are supplied with fully authenticated certificates of analyses and a location map for standard identification.
A Faraday Cup, for accurate specimen current measurements is available as an optional extra on all mounts. The standards are mounted in brass holders.
Electron Microscopy Sciences SEM Finder Grid SEMF2, Copper
Designed to aid in the identification and localization of SEM specimens when placed on standard SEM stubs. Larger cells identified 1-57 & subdivided into 4. 228 identifiable cells.
Material: Copper
Diameter: 10 mm
Thickness: ~50 µm
Electron Microscopy Sciences Gilder Aperture Grid with Single 1000 µm hole, Nickel
Single Slot aperture grids have a thickness of are 50 microns. Aperture diameter is 1000 um.
Material: Nickel
Electron Microscopy Sciences BEEM Capsule Holder, Clear
If microwaving or UV polymerizing of your embedding media these opaque BEEM capsule holders are perfect. Made from Polypropylene. All embedding capsules size 00 fit it.
Electron Microscopy Sciences TEM Screen Recoating Zeiss EM902 Large
For optimum viewing, fluorescent screens should be recoated regularly. Viewing screens are easily damaged by the electron beam, especially at high accelerating voltages where knock-on damage can be severe. A proprietary process where 1 to 2 micron particles of phosphor are deposited on the screen and produce the highest possible resolution.
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1/2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Height: 3/8"
Electron Microscopy Sciences EMS Microscope Stage Micrometer SM-3
SM-3 is useful for calibration of magnification in microscopes and other optical magnification systems. Its auto-location features can be used for testing of an image analysis auto-location system. Chrome on Glass. Linear Reference Scales: Glass Size - 1" x 3". Scale Length - 0.04 inch X & Y axis, 10.0 mm X & Y axis. Divisions- English = 0.0005”; Metric = 10um. With numerical labeling every 0.1 mm and 0.05”.
Electron Microscopy Sciences EMS Linear (X&Y) Stage Micrometer, Model IAM-2
A dual axis linear micrometer that can accurately calibrate both X and Y directions without rotation, for optical magnification, and camera aspect ratio using single standard. In addition, it can be used to calibrate and check linear stage motion or related auto measuring systems. Scales are in both English and Metric measurements.
Electron Microscopy Sciences BEEM Capsule Holder Multi Task
The Multi-Task BEEM Capsule Holder is designed to hold size "00" BEEM capsule during resin polymerization. Use when embedding and polymerizing resin by microwave under water. The direct contact of the microwave energy to the resin causes the resin to heat to quick and leads to micro bubbles inside the resin block and possible damage to the tissues. This is eliminated by immersing the resin capsule in a water bath during microwaving. This ʽindirect contact' of microwave energy to the resin will help the embedding block polymerize nicely and homogeneously and avoids the overheating of the tissue.
Mold is machined from polyethylene block, comes in two parts: bottom part which holds the BEEM capsule, and the second part which is placed on top and is securd by two plastic screws to ensure the BEEM capsules are in place and capsule lid will not pop out during under water polymerization or microwave irradiation.
Electron Microscopy Sciences SEM Hitachi S-450 M4 Mount Plain Surface 5/8",1/4" height, Carbon
Hitachi S-450 SEM mounts with M4 tapered hole and female thread. Made from spectroscopically pure carbon.
Head: 5/8"
Height: 1/4"
Electron Microscopy Sciences SEM Stub Hitachi Cylinder 5/8" surface, 1/2"height, Aluminum
Hitachi SEM mounts are made from lathe finished ultra-pure aluminum.
Head: 5/8"
Height: 1/2"
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/2-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 2.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences JEOL SEM JSM 840 Cylinder Mount 1" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1"
Height: 3/8"